The optics laboratory contains a suite of instruments for characterizing optical sources, particularly lasers, and the optical properties of materials. Some of these instruments are connected by single-mode optical fiber to JILA research groups laboratories. The fiber links allow the instruments to be used remotely. The results are read back from a server over a new high-speed local area network installed as part of the Keck lab. The measurements performed by some instruments do not allow intervening fiber; these instruments are located on carts so that they can moved into research labs. Others remain in the Keck Laboratory. The optics lab is also used for teaching alignment and operation of ultrafast lasers.

• Beam Profiler
• Dimensional AFM
• Diode-pumped Laser and Ti:Sapphire Laser
• Ellipsometer
• Fiber Cleaver
• Fiber Fusion Splicer
• Fizeau Interferometer
• Frequency Resolved Optical Gating Apparatus
• Fourier Transform Infrared Spectrometer
• Multi-mode Atomic Force Microscope
• Optical Multimeter
• Optical Spectrum Analyzer
• Oscilloscope
• Patch Panel
• Polarimeter
• Radio Frequency Spectrum Analyzer
• Scanning Electron Microscope
• Stabilized Helium-Neon Laser
• UV-VIS-NIR Spectrophotometer
• Wavemeter

Displays the spatial profile of a laser beam (cart).

Make: Spiricon
Model: LBA-500PC & M2-200-500
Filter Wheel: LBS-160
Camera: DVC-10
Top Used for profiling features and determining critical dimensions on substrates as large as 6" in diameter.

Make: Digital Instruments
Model: Dimension 3100
Top Ti:sapphire is the standard laser medium used to produce ultrashort pulses. This laser will be used to train students on the basics of laser alignment and advanced students on the production of ultrashort pulses. The laser was purchased in kit form to be more useful as a teaching tool.

Make (pump laser): Coherent
Model: Verdi
Output Power: 5W
Wavelength: 532 nm
Make (Ti:sapphire laser): K/M Labs
Wavelenght: 800 nm

Top Determines the thickness and optical constants of thin dielectric films. Used to characterize optical coatings.

Make: J.A. Woollam
Model: VASE-VB 250
Type: Variable Angle, Spectroscopic
Angle of Incidence Range: 20 degrees – 90 degrees (transmission)
Angular Resolution: 18 arc seconds
Wavelength Range: 240nm – 1100nm
Probe Diameter: 3 mm (100 microns with probe tubes)
Top Used for straight and angle cleaving of fiber optics.

Make: PK Technology
Model: FK12
Top Produces very low loss splices between optical fibers by fusing the fibers together (cart).

Make: Eriksson
Model: FSU 975
Top Characterizes the flatness of optical elements and is used in conjunction with the grinding and polishing facility.

Make: Zygo
Model: GPI XP
Features: Telescope for characterizing small samples

Top Allows the complete electric field (amplitude and phase) of an ultrashort optical pulse to be determined (cart).

Make: KM Labs
Model: SHGF-10
Top Measures the transmission and reflection properties of optical elements and materials in the far infrared

Make: Nicolet Instruments
Model: Nexus 670
Wavelength Range: 7400cm^-1 – 200cm^-1 (1351nm – 50m)
Resolution: 0.09 cm^-1
Top Scanning probe microscope used to characterize surfaces with atomic resolution.

Make: Digital Instruments
Type: MMAFM-2

Top Measures optical power.

Make: Hewlett Packard
Wavelength range: 450–1700 nm
Sensitivity: -100 dBm (vis), -110 dBm (near-IR)
Top Provides measurement of optical spectra from 300–1700 nm with 0.05 nm resolution. This is a general purpose instrument.

Make: Ando
Model: AQ6315E
Wavelength Range: 350–1750 nm
Resolution: .05 nm
Sensitivity: -65 dBm
Maximum Power: +20 dBm
Dynamic Range: 70 dB
Top Measures wave forms in the time domain. An optical to electronic converter allows it to monitor pulses produced by lasers (fiber).

Make: Tektronix
Model: TDS754C
Analog Bandwidth: 500 MHz
Sample rate: 2 Gs/sec

Top Allows different labs in JILA to be connected to the fiberized instruments in the Keck Lab. Also allows JILA labs to be connected to one another. The top portion of the cabinet is occupied by high-speed network switches to allow remote access to the measurement results.
Top Measures the polarization state of a laser beam and displays the results in real time on the Poincarè sphere (cart).

Make: Thorlabs
Wavelength Range: 400–1600 nm (two optical heads)
Top Provides a frequency domain characterization of electrical signals. An optical-to-electrical converter allows use with lasers. Useful in measuring the beat between two lasers.

Make: Hewlett Packard
Model: HP8593E
Frequency Range: 9 KHz to 22 GHz
Resolution Bandwidth: 30 Hz
Top Performs electron microscopy with 3.5 nm resolution. It can also be used to do electron beam lithography.

Make: JEOL
Model: JSM-6400
Detector Types: Secondary Electron, Backscatter
Acceleration Voltages: 0.2–40 KV
Magnification: 10X–300,000X
Resolution: 35 Angstroms
Maximum Sample Size: 50mm x 75mm
Stage: Custom, high resolution motorized stage
Features: Externally addressed scan coils for E-beam writing
Image Output Types: Thermal, Polaroid, 35mm film, Image capture to networked computer
Accessories: A small Au/Pd sputterer is available for non-conductive samples

Top This laser is stabilized to Iodine to provide an absolute frequency reference at optical frequencies.

Model: 100
Wavelength: 633 nm (nominal frequency of 474 THz)
Output power: 75 microwatts minimum (100–125 typical)
Frequency Accuracy: 2.5 parts in 10¹¹

Allan Variance:
1 x 10^-11 (1 sec)
3 x 10^-12 (10 sec)
1 x 10^-12 (100 sec)
3 x 10^-13 (1000 sec)
Top Measures the transmission and reflection properties of optical elements and materials from the ultraviolet to near infrared wavelengths.

Make: Varian
Model: Cary 500
Type: UV-VIS-NIR Wavelength
Range: 175nm–3300nm (57,142cm^-1 – 3030cm^-1)
Resolution: 0.03nm
Top Measures the frequency of a laser with an accuracy of 1 megahertz. For use with stabilized single frequency lasers.

Make: NIST Time & Frequency Division
Precision: 1 part in 10⁹
Top

* Mention of commercial products is for information only; it does not imply NIST recommendation or endorsement, nor does it imply that the products mentioned are necessarily the best available for the purpose.

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