Metrology Lab
Reserve Metrology Lab EquipmentThe W. M. Keck Optical Measurements Laboratory is located in JILA S105 and contains a suite of instruments for characterizing optical sources and the optical properties of materials.
Beam Profiler
Displays the spatial profile of a laser beam and beam propagation information (cart).
- Make: Spiricon
- Model: Beam Gage & M2-200s-FW-A
- Filter Wheel: LBS-160
- Camera: SP300
Data Logger
Data acquision device for vibration, acoustic, and electromagnetic measurements.
- Make: Measurement Computing Corporation
- Model: WebDAQ 504
- Connectivity: Ethernet, WiFi, USB or SD memory data transfer
- Number of Channels: 4
- Resolution: 24 bits
- Frequency: 13.1072 MHz
- Data Rate: 1.652 kS/s to 51.2 kS/s
- Accelerometers: (4) PCB Piezotronics, Inc. Model 393B12, 3-Axis Block
- Magnetometer: Applied Physics Systems Model 533
- Microphone: PCB Piezotronics, Inc. Model 130A24
Ellipsometer
Determines the thickness and optical constants of thin dielectric films. Used to characterize optical coatings
- Make: J.A. Woollam
- Model: VASE-VB 250
- Type: Variable Angle, Spectroscopic
- Angle of Incidence Range: 20 degrees - 90 degrees (transmission)
- Angular Resolution: 18 arc seconds
- Wavelength Range: 240nm - 1100nm
- Probe Diameter: 3 mm (100 microns with probe tubes)
Fiber Cleaver
Used for straight and angle cleaving of fiber optics.
- Make: PK Technology
- Model: FK12
Fiber Fusion Splicer
Produces very low loss splices between optical fibers by fusing the fibers together.
- Make: Eriksson
- Model: FSU 975
Fizeau Interferometer
Wavefront analyzer for characterizing the flatness of optical elements.
- Make: Zygo
- Model: GPI XP
- Aperture: 4"
- Reference Flatness: Lambda/50
- Accessories: 4" to 33mm converter for characterizing small samples
Fluorometer
Used for measuring emission spectrum of a sample as a function of excitation wavelength.
- Make: HORIBA Jobin Yvon
- Model: Fluorolog-3 FL3-222
- Resolution: 0.2 nm
- Accuracy: ±0.5 nm
- Speed: 150 nm/s
- Range: 0-1300 nm
- Gratings: Excitation blaze: 330 nm (200-700 nm range)
- Emission blaze: 500 nm (300-1000 nm range)
- Accessories: Thermo-electric cooler sample chamber attachment
Fourier Transform Infrared Spectrometer (FT-IR)
Measures the transmission and reflection properties of optical elements and materials in the far infrared.
- Make: Thermo Electron
- Model: Nicolet iS50 Advanced
- Wavelength Range: 7800cm-1 - 200cm-1 (1.282um - 50um)
- Resolution: 0.09 cm-1
Digital Microscope
Used for routine light microscopy.
- Make: Keyence
- Model: VHX-7000
- Features: Tiltable objective head with integrated camera and depth composition. Coaxial, ring, and mixed lighting. DIC filters available.
- Objectives: 20X-80X, 100X-400X, 500X-2500X
Optical Microscope
Used for routine light microscopy.
- Make: Leica
- Model: M80
- Type: Stereoscopic
- Magnification: 7.5X to 60X Zoom
- Camera: Leica IC90 E
Optical Power Meters
Measures optical power.
- Make: Cascade Laser Corp FieldMaster-GS, Newport 840, FIS OV-PM Fiber Optic
- Wavelength range: 190nm - 20 um, 200nm-1100nm, 850/1310/1550nm
- Power range: 10nW - 5kW, 5pW - 200mW, -65 to +5 dB
Optical Profilometer
Measures feature height and surface quality.
- Make: Veeco
- Model: Wyko NT3300
- Type: White light vertical scan interferometer, 633nm phase shift interferometer
- Objectives: 2.5X Mickelson, 10X Mireau, 50X Mireau
- Multipliers: 0.5X, 0.75X, 1X, 2X
- Stage: 8" x 8" motorized
- Features: Automated stitching, VLSI step height standards
UV-VIS-NIR Spectrophotometer
Measures the transmission and reflection properties of optical elements and materials from the ultraviolet to near infrared wavelengths.
- Make: Agilent
- Model: Cary 5000
- Type: UV-VIS-NIR Wavelength
- Range: 175nm-3300nm (57,142cm-1 - 3030cm-1)
- Resolution: 0.03nm
- Specimen Chamber Capacity: 8" x 8" maximum sample size
- Attachments: Universal Measurement Accessory (UMA, Equivalent to a Cary 7000), Specular Reflectance Accessory, Variable Angle Transmittance
